Direct imaging of reverse-bias leakage through pure screw dislocations in GaN films grown by molecular beam epitaxy on GaN templates

By J. Hsu, Michael Manfra, R. Molnar, B. Heying, J. Speck. 2002

282 citations recorded by the source corpus.

Subfields: Condensed Matter Physics, Electrical and Electronic Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/e01341e0d8040bc67fbfbb125eaccf2819540d54