Degradation analysis of weathered crystalline-silicon PV modules

By C. Osterwald, Allan Anderberg, S. Rummel, L. Ottoson. Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists Conference, 2002., 2002

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Analysis of degradation mechanisms of crystalline silicon PV modules after 12 years of operation in Southern Europe (2011, methodology): “As no yellowing of the encapsulant was observed, and glass weathering plays only a minor role, we believe that the loss of short-circuit current could be due to (i) the front delamination, (ii) the degradation of the AR coating layer and (iii) an inherent degradation of the p–n junction, related to ”
Accelerated testing and failure of thin‐film PV modules (2004, unknown): “One study looked at diminishing short-circuit current in crystalline Si modules where UV dose was the metric of consequence.(16) These tests were not very accelerated; the highest factor was in the 3X outdoor system.”
Commonly observed degradation in field-aged photovoltaic modules (2002, background): “mechanical damage, and cell degradation have been recently reported [2][ 3 ][4][5][6].”
History of accelerated and qualification testing of terrestrial photovoltaic modules: A literature review (2009, unknown): “NREL published results of a 5-year x-Si lightsoaking experiment under real-time outdoor, accelerated outdoor with mirror enhancement, UVA fluorescent, and Xe arc lamp illumination.(146,147) A correlation between the total UV exposure dose and module Isc for all exposures showed that UV radiation cau”