Accelerated testing and failure of thin‐film PV modules
By T. J. McMahon. 2004
138 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Renewable Energy, Sustainability and the Environment
View Paper: https://www.semanticscholar.org/paper/fc6eb28a33905ab8c85e81ebff48c8df4217bdb4
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In Electrical and Electronic Engineering
- F. C. Krebs
- M. Jørgensen
- Suren A. Gevorgyan
- O. Inganäs
- A. Urbina
- M. Lira-Cantú
- Fengling Zhang
- E. Bundgaard
In Renewable Energy, Sustainability and the Environment
Citations in the corpus
- Consensus stability testing protocols for organic photovoltaic materials and devices (2011, background): “Thin-film technologies like a-Si, CdTe, and CIGS have reported problems with electrochemical corrosion of SnO2:F or notable sensitivity of the ZnO-based transparent conducting oxide to moisture, as well as shunt hot spots at scribe lines and weak diodes/hot spots due to non-uniformities in processin”
- Evaluation of high‐temperature exposure of photovoltaic modules (2011, background): “McMahon [6] documented how to calculate the acceleration factor for accelerated thermal testing if the temperature dependence of the aging is quantified.”
- History of accelerated and qualification testing of terrestrial photovoltaic modules: A literature review (2009, unknown): “A 2004 review by McMahon discussed the stresses imposed by individual tests on thin-film modules, and diagnostic methods that can be used to detect failures.(156) Failure modes and mechanisms of many thin-film module types were reviewed with causes listed such as cells separating from module interco”