Three-dimensional analysis of scattering losses due to sidewall roughness in microphotonic waveguides

By Tymon Barwicz, Hermann A. Haus. Journal of Lightwave Technology, 2005

215 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/dc33e6024bb0375f78e912190b63e9b4b957c730

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In Electrical and Electronic Engineering

1. Alexander Gaeta
2. Michal Lipson
3. J. Cardenas
4. A. Dutt
5. David J. Moss
6. Roberto Morandotti
7. Arnan Mitchell
8. Xingyuan Xu

Citations in the corpus

• Ultra-low-loss on-chip resonators with sub-milliwatt parametric oscillation threshold (2017, methodology): “η1, η2, and η3 are factors that account for the interaction of the field with the waveguide core, the top and bottom surfaces, and the sidewalls, respectively, for the wider waveguides relative to the narrower waveguide [59] and are calculated using Finite element method simulations (performed with ”
• Fabrication of add-drop filters based on frequency-matched microring resonators (2006, background): “Electrons backscattered by the core material increase the dose delivered near the resist-dielectric interface.”