Modeling for bipolar resistive memory switching in transition-metal oxides
By J. Hur, Myoung-Jae Lee, Chang Bum Lee, Young-Bae Kim, Changjung Kim. 2010
170 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry, Polymers and Plastics
View Paper: https://www.semanticscholar.org/paper/d948aa821c991ff17f14639e9c9adf7a5d99c9ec
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In Electrical and Electronic Engineering
- Giacomo Indiveri
- B. Linares‐Barranco
- T. Serrano‐Gotarredona
- John Paul Strachan
- Feng Miao
- T. Prodromakis
- Timothée Masquelier
- Matthew D. Pickett
In Materials Chemistry
Citations in the corpus
- State Dynamics and Modeling of Tantalum Oxide Memristors (2013, background): “The resulting device model constrains some of the underlying physical mechanisms for explaining the switching in tantalum oxide [15], [22], [26], and we”
- STDP and STDP variations with memristors for spiking neuromorphic learning systems (2013, background): “…phenomena like migration of oxygen ions (Nian et al., 2007) and vacancies (Yang et al., 2008), the lowering of Schottky barrier heights by trapped charge carriers at interfacial states (Hur et al., 2010), and the phase-change in some PCM (phase change materials) devices (Wuttig and Yamada, 2007).”