Metrological characterization of X-ray diffraction methods at different acquisition geometries for determination of crystallite size in nano-scale materials

By V. Uvarov, I. Popov. 2013

498 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Materials Chemistry, Radiation

View Paper: https://www.semanticscholar.org/paper/2d3f36a194da9f8894d323f769144a244f568946