Principle of ferroelectric domain imaging using atomic force microscope

By Seungbum Hong, J. Woo, Hyunjung Shin, J. Jeon, Y. Pak, E. Colla, N. Setter, Eunah Kim, K. No. 2001

311 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/d5f4d9e5b5b49620b740c6b2d201d53ce78f46fc

How researchers see this paper

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In Atomic and Molecular Physics, and Optics

1. Yunseok Kim
2. Bora Kim
3. Daehee Seol
4. E. Soergel

In Biomedical Engineering

1. Yunseok Kim
2. Bora Kim
3. Daehee Seol
4. E. Soergel

In Materials Chemistry

1. Yunseok Kim
2. Bora Kim
3. Daehee Seol
4. E. Soergel

Citations in the corpus

• Non-piezoelectric effects in piezoresponse force microscopy (2017, methodology): “Such local and non-local electrostatic effects can arise from the various electrical interactions between the AFM tip/cantilever and sample surface, such as the capacitive interaction,[80, 81] the CPD,[79, 82] the application of an external voltage to the entire sample, and the corresponding injecte”
• Piezoresponse force microscopy (PFM) (2011, background): “An electrostatic contribution to the PFM signal can also be caused by a Coulomb force acting directly on the cantilever and bending it [106].”