High-κ Dielectric Materials for Microelectronics
By Robert M. Wallace, G. Wilk. 2003
188 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/d43fd0a2f262a0906272e853ba9ffdb9699e1e05
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In Electrical and Electronic Engineering
In Materials Chemistry
Citations in the corpus
- Oxides, Oxides, and More Oxides: High-κ Oxides, Ferroelectrics, Ferromagnetics, and Multiferroics (2009, background): “The benefits of high-κ dielectrics can be clearly understood from Equation [1], which represents an equivalent oxide thickness (EOT) t |eq , a quantity used to compare performance of high-κ dielectric MOS gates with performance of SiO2-based MOS gates.”