A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications | NIST

By Andrew L. Rukhin, Juan Soto, James Nechvatal, M. Smid, Elaine B. Barker, Stefan Leigh, M. Levenson, M. Vangel, D. Banks, N. Heckert and 2 more. 2001

449 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/d3f002dd0d6f56bc3bdf9493f734f1abe5a999d0

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Citations in the corpus

Parallel random numbers: As easy as 1, 2, 3 (2011, unknown): “Several statistical tests for PRNGs have been developed [4, 20, 26, 38], but the most comprehensive is TestU01 [24], which provides a consistent framework as well as batteries of tests that are supersets of the earlier suites, in addition to an assortment of tests from other sources that had not pre”
Quantum random number generators (2016, methodology): “For that reason, security recommendations like the AIS 31 standard of the German Bundesamt 30 für Sicherheit in der Informationstechnik (Killmann and Schindler, 2011) or the draft of NIST SP 800-90B (Turan et al., 2016) ask for some kind of self testing inside true random number generators.”
Power-Up SRAM State as an Identifying Fingerprint and Source of True Random Numbers (2009, unknown): “3) Statistical Testing of Extracted Random Bits: While minentropy is intended as the primary assurance of randomness for the generated bits, these bits are also tested using the runs, approximate entropy, and block frequency tests from the NIST suite [37].”
Security of IoT systems: Design challenges and opportunities (2014, unknown): “The outputs from a LUT network exhibit excellent statistical security properties; for example, they pass all NIST randomness tests [28].”
Random Number Generation (2008, methodology): “…walks on the real line or over the integers, tests based on the linear complexity of a binary sequence, tests based on the simulation of dice or poker hands, and many others (Gentle, 2003, Knuth, 1998, L’Ecuyer and Simard, 2007, Marsaglia, 1996, Rukhin et al., 2001, Vattulainen et al., 1995).”
Fast physical random bit generation with chaotic semiconductor lasers (2008, methodology): “[6] Rukhin, A.”