Structure and hydrogen content of polymorphous silicon thin films studied by spectroscopic ellipsometry and nuclear measurements
By A. F. Morral, P. Cabarrocas, C. Clerc. 2004
171 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/cf2f503a3760449365916d3f57b6726d1d6f7f8e
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In Electrical and Electronic Engineering
In Materials Chemistry
Citations in the corpus
- Colloquium: Reactive plasmas as a versatile nanofabrication tool (2005, background): “…performance of PIN solar cells sp-type semiconductor/insulator/ n-type semiconductord can be significantly improved through nanocrystalline susually 1–2 nmd inclusions deposited with high rates in silane-based PECVD sPoissant et al., 2003; Fontcuberta i Morral et al., 2004; Suendo et al., 2004d.”