Quality-augmented fusion of level-2 and level-3 fingerprint information using DSm theory

By Mayank Vatsa, Richa Singh, Afzel Noore, Max M. Houck. International Journal of Approximate Reasoning, 2009

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A 1200-V, 60-A SiC MOSFET Multichip Phase-Leg Module for High-Temperature, High-Frequency Applications (2014, unknown): “Compared to Si, SiC MOSFETs require a higher gate electric field in order to achieve lower RDS(on) , due to their lower channel mobility [30].”
Fusion Techniques for Reliable Information: A Survey (2010, unknown): “…theoretic fusion algorithms, the combination of the particle filtering and the DSmT for conflict information handling, and a qualitative belief condition rule are studied from many researchers to solve complex, static or dynamic fusion problems beyond the limits of the DST [62], [91], [95], [102].”
Power Electronics Reliability: State of the Art and Outlook (2021, background): “On the other hand, unique reliability issues compared to Si devices give a lower cycling capability with conventional packaging and reduced shortcircuit withstand time [24].”
Review and analysis of SiC MOSFETs’ ruggedness and reliability (2020, background): “Secondly, three times wider bandgap of SiC than Si induces smaller conduction band and valence band offsets with the gate oxide (SiO2), leading to strong influence on the Fowler–Nordheim tunnelling current flow into the gate oxide and SiC MOSFETs’ degradation under accelerated stress [8].”