PDFgetX2: a GUI-driven program to obtain the pair distribution function from X-ray powder diffraction data

By Xiangyun Qiu, Jeroen W. Thompson, Simon J. L. Billinge. 2004

550 citations recorded by the source corpus.

Subfields: Electronic, Optical and Magnetic Materials, Industrial and Manufacturing Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/c2bbf0f20e8dc618657665ff5b5cbfcb89ba2678

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electronic, Optical and Magnetic Materials

1. Karena W. Chapman
2. Peter J. Chupas
3. Pavol Juhas
4. Christopher Lyn Farrow
5. Timur Davis
6. P. Lee
7. B. Ingham

In Industrial and Manufacturing Engineering

1. Karena W. Chapman
2. Peter J. Chupas
3. P. Lee

In Materials Chemistry

1. Karena W. Chapman
2. Peter J. Chupas
3. Pavol Juhas
4. Christopher Lyn Farrow
5. P. Lee
6. Timur Davis
7. Simon J. L. Billinge
8. B. Ingham

Citations in the corpus

• Applications of an amorphous silicon-based area detector for high-resolution, high-sensitivity and fast time-resolved pair distribution function measurements (2007, methodology): “The PDFs, G(r) = 4 r[ (r) o], where (r) and o are the instantaneous and average densities, were extracted using PDFgetX2 (Qiu et al., 2004), subtracting the contributions from the sample environment and background to the measured diffraction intensities.”
• PDFgetX3: a rapid and highly automatable program for processing powder diffraction data into total scattering pair distribution functions (2012, methodology): “…2012), including background subtraction, polarization, self-absorption, multiple scattering and Compton scattering, among many others, and these are implemented in PDFgetX2 (Qiu et al., 2004) and other similar programs (Petkov, 1989; Petkov & Danev, 1998; Jeong et al., 2001; Soper & Barney, 2011).”