Applications of an amorphous silicon-based area detector for high-resolution, high-sensitivity and fast time-resolved pair distribution function measurements
By Peter J. Chupas, Karena W. Chapman, P. Lee. 2007
175 citations recorded by the source corpus.
Subfields: Electronic, Optical and Magnetic Materials, Geophysics, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/2a23f0518734dc017311fd5639409268b620aeee
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In Electronic, Optical and Magnetic Materials
In Materials Chemistry
Citations in the corpus
- PDFgetX3: a rapid and highly automatable program for processing powder diffraction data into total scattering pair distribution functions (2012, background): “…use of 2D detectors, modern beamlines are yielding total scattering data at unprecedented rates allowing detailed parametric and time-resolved total scattering studies to be carried out in special environments (Chupas et al., 2004; Chupas et al., 2007; Jensen et al., 2012; Redmond et al., 2012).”