Unipolar resistive switching characteristics of ZnO thin films for nonvolatile memory applications
By W. Chang, Yen-Chao Lai, Tai-bor Wu, Sea-Fue Wang, Frederick T. Chen, M. Tsai. 2008
451 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Polymers and Plastics
View Paper: https://www.semanticscholar.org/paper/c25846b4ce88cdd2d398ad1a3cc3ce10f2a41d67
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In Electrical and Electronic Engineering
In Polymers and Plastics
Citations in the corpus
- A Phenomenological Model for the Reset Mechanism of Metal Oxide RRAM (2010, unknown): “, Pt/ZrO2/Pt [11], Pt/HfO2/Pt [12], Pt/ZnO/Pt [13], etc.”
- Mechanism of nonvolatile resistive switching in graphene oxide thin films (2011, background): “[17] Chang WY, Lai YC, Wu TB, Wang SF, Chen F, Tsai MJ.”
- Resistive Switching Characteristics of Sol–Gel Zinc Oxide Films for Flexible Memory Applications (2009, background): “It is known that the HRS current in ZnO oxide films can be explained by Poole–Frenkel emissions [2] or by hopping conduction [3].”