Measurement of the effect of self-heating in strained-silicon MOSFETs

By K. Jenkins, K. Rim. IEEE Electron Device Letters, 2002

150 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/be18b53e0a178722f744aa631c1fa2eef277015e

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Eric Pop

Citations in the corpus

• Energy dissipation and transport in nanoscale devices (2010, background): “The thermal resistance of many semiconductor devices has been measured through noise thermometry [67], gate electrode electrical resistance thermometry [73, 76], pulsed voltage measurements [13, 69], or an AC con-”