Chemical identification of individual surface atoms by atomic force microscopy

By Y. Sugimoto, P. Pou, M. Abe, P. Jelínek, R. Pérez, S. Morita, O. Custance. Nature, 2007

628 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/b9621dd8936f0ec81acc1770040d17ca0db8f54f

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. L. Gross
2. Michele Celebrano
3. Alessandro Curioni
4. Philipp Kukura
5. G. Meyer
6. Vahid Sandoghdar
7. Nikolaj Moll
8. A. Renn

In Electrical and Electronic Engineering

1. L. Gross

Citations in the corpus

• Single-molecule imaging by optical absorption (2011, methodology): “One of the promises of our methodology lies in surface science, where single-atom sensitivity has only been achieved using scanning probe microscop”
• The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips (2010, methodology): “Atoms were resolved with chemical identification [3]; the magnetic exchange force was measured with atomic resolution [4]; individual atoms were manipulated [5, 6], and the forces during atomic manipulation were determined [7].”
• Detection and characterization of engineered nanoparticles in food and the environment (2008, methodology): “Nevertheless, the force patterns that emerge can also help in identifying the nature of individual atoms via a technique called chemical force microscopy (CFM) (Sugimoto et al. 2007; Shluger and Trevethan 2007).”