Embedded deterministic test for low cost manufacturing test

By J. Rajski, J. Tyszer, M. Kassab, N. Mukherjee, R. Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, G. Eide and 1 more. Proceedings. International Test Conference, 2002

409 citations recorded by the source corpus.

Subfields: Control and Systems Engineering, Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/b4bade543f320a7d8994f63397d052d2eda67e4c

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1. J. Rajski
2. J. Tyszer
3. M. Kassab
4. N. Mukherjee

Citations in the corpus

• Embedded deterministic test (2004, background): “compaction scheme is designed in a distinct manner so that it does not compromise test coverage [33], [34].”