Electronic and chemical properties of the c-Si/Al2O3 interface

By F. Werner, Boris Veith, D. Zielke, L. Kühnemund, C. Tegenkamp, M. Seibt, R. Brendel, Jan Schmidt. 2011

240 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/b4665de9ebc4990877e56eb27fd325df23eee7ea