Dual-frequency resonance-tracking atomic force microscopy
By B. Rodriguez, Clint Callahan, Sergei V. Kalinin, Roger Proksch. 2007
511 citations recorded by the source corpus.
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase locked loops are not possible. This includes techniques with non-acoustic driving where the phase of the driving force is frequency and/or position dependent. An example of the latter is piezoresponse force microscopy (PFM), where the resonant frequency of the cantilever is strongly dependent on the contact stiffness of the tip–surface junction and the local mechanical properties, but the spatial variability of the drive phase rules out the use of a phase locked loop. Combined with high-voltage switching and imaging, dual-frequency, resonance-tracking PFM allows reliable studies of electromechanical and elastic properties and polarization dynamics in a broad range of inorganic and biological systems, and is illustrated using lead zirconate–titanate, rat tail collagen, and native and switched ferroelectric domains in lithium niobate.
Subfields: Atomic and Molecular Physics, and Optics, Cell Biology, Control and Systems Engineering
View Paper: https://www.semanticscholar.org/paper/a2ee8b3294fe00fe9a0bc8f9020e2e3a257a501f
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In Atomic and Molecular Physics, and Optics
Citations in the corpus
- Strain-based scanning probe microscopies for functional materials, biological structures, and electrochemical systems (2015, methodology): “The first is the dual amplitude resonance tracking (DART) technique, which was previously referred to as the dual frequency resonance tracking (DFRT) technique [23].”
- Non-piezoelectric effects in piezoresponse force microscopy (2017, background): “These techniques, which include dual ac resonance tracking (DART)[66, 67] and band excitation (BE),[68, 69] significantly enhance the signal-to-noise ratio of the observed PFM response, which facilitates the achievement of vertical (z-height) resolutions at the picometer level.”
- Two-dimensional materials with piezoelectric and ferroelectric functionalities (2018, methodology): “PFM uses the inverse-piezoelectric effect to characterize ferroelectricity, with PFM amplitude reflecting the magnitude of the polarization and the PFM phase indicating the polarization direction.(44,106) As shown in Fig.”