Tin whiskers studied by focused ion beam imaging and transmission electron microscopy

By G. Sheng, C. F. Hu, W. Choi, King-Ning Tu, Y. Bong, L. Nguyen. 2002

142 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/9f13ddcc1088de77ee871044b849c0fdcadf5739

Citations in the corpus

• Annotated tin whisker bibliography and anthology (2005, unknown): “[88], in 2002 studied whisker formation in Sn-Cu alloy coatings and concluded that Cu alloying in amounts of about 1% significantly increased the number of whiskers formed and the whisker growth rates relative to pure tin.”