Device mismatch and tradeoffs in the design of analog circuits

By Peter R. Kinget. IEEE Journal of Solid-State Circuits, 2005

511 citations recorded by the source corpus.

Subfields: Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/97e3d736f8ef497b0b713a8fbba1e7a974eee41a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Biomedical Engineering

1. Anantha P. Chandrakasan
2. Naveen Verma
3. Massimo Alioto

In Electrical and Electronic Engineering

1. Anantha P. Chandrakasan
2. Naveen Verma
3. Massimo Alioto
4. Mohamed F. Younis
5. Xuxun Liu
6. Deborah Estrin
7. Ian F. Akyildiz
8. Limin Wang

Citations in the corpus

• A 256 kb 65 nm 8T Subthreshold SRAM Employing Sense-Amplifier Redundancy (2008, background): “The remaining source of offset is local variation, which is modeled as a random effect, whose standard-deviation is inversely related to the square root of the device areas [13], [14].”