Role of order and disorder on the electronic performances of oxide semiconductor thin film transistors
By Rodrigo Martins, Pedro Barquinha, I. Ferreira, Luís Pereira, G. Gonçalves, Elvira Fortunato. 2007
211 citations recorded by the source corpus.
The role of order and disorder on the electronic performances of n-type ionic oxides such as zinc oxide, gallium zinc oxide, and indium zinc oxide used as active (channel) or passive (drain/source) layers in thin film transistors (TFTs) processed at room temperature are discussed, taking as reference the known behavior observed in conventional covalent semiconductors such as silicon. The work performed shows that while in the oxide semiconductors the Fermi level can be pinned up within the conduction band, independent of the state of order, the same does not happen with silicon. Besides, in the oxide semiconductors the carrier mobility is not bandtail limited and so disorder does not affect so strongly the mobility as it happens in covalent semiconductors. The electrical properties of the oxide films (resistivity, carrier concentration, and mobility) are highly dependent on the oxygen vacancies (source of free carriers), which can be controlled by changing the oxygen partial pressure during the deposition...
Subfields: Electrical and Electronic Engineering, Materials Chemistry, Polymers and Plastics
View Paper: https://www.semanticscholar.org/paper/97dc386cfeea730ee834de6c5702595f802e527c
Citations in the corpus
- Gallium–Indium–Zinc-Oxide-Based Thin-Film Transistors: Influence of the Source/Drain Material (2008, unknown): “, zinc–tin oxide (ZTO) [8], indium–zinc oxide (IZO) [7], [9], [10], and”