Investigation of dead-layer thickness in SrRuO3/Ba0.5Sr0.5TiO3/Au thin-film capacitors

By L. Sinnamon, R. Bowman, J. Gregg. 2001

154 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/91fa79aa88dfa4e55ebd59467dbca640392380df

How researchers see this paper

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In Electrical and Electronic Engineering

1. J. Seidel
2. Ramamoorthy Ramesh
3. J. Scott

In Materials Chemistry

1. J. Scott
2. Ramamoorthy Ramesh
3. G. Catalán
4. J. Seidel
5. K. Rabe

Citations in the corpus

• Domain wall nanoelectronics (2012, background): “…explanations for the worsening of the dielectric constant of thin films, although the exact nature, thickness, and even location of the dead layer, which might be inside the electrode, is still a subject of debate (Sinnamon, Bowman, and Gregg, 2001; Stengel and Spaldin, 2006; Chang et al., 2009).”