GaN‐based epitaxy on silicon: stress measurements

By A. Krost, Armin Dadgar, G. Straßburger, R. Clos. 2003

144 citations recorded by the source corpus.

Subfields: Condensed Matter Physics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/8d50e6b32bed0f4922921f23205a39c38518d58d