Gated four-probe measurements on pentacene thin-film transistors: Contact resistance as a function of gate voltage and temperature

By Paul V. Pesavento, R. Chesterfield, C. Newman, C. Daniel Frisbie. 2004

288 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/87a02bf666f559a35d524e31d02d2d509aa80565

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In Electrical and Electronic Engineering

  1. C. Daniel Frisbie
  2. J. Mannhart
  3. M. Di Ventra
  4. Andy Thomas
  5. Mohammed Affan Zidan
  6. Khaled Nabil Salama
  7. Zhenan Bao
  8. Yuriy V. Pershin

Citations in the corpus