Gated four-probe measurements on pentacene thin-film transistors: Contact resistance as a function of gate voltage and temperature
By Paul V. Pesavento, R. Chesterfield, C. Newman, C. Daniel Frisbie. 2004
288 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/87a02bf666f559a35d524e31d02d2d509aa80565
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Electrical and Electronic Engineering
- C. Daniel Frisbie
- J. Mannhart
- M. Di Ventra
- Andy Thomas
- Mohammed Affan Zidan
- Khaled Nabil Salama
- Zhenan Bao
- Yuriy V. Pershin
Citations in the corpus
- Electrostatic modification of novel materials (2006, background): “It shows that the injection mechanism and contact current-voltage characteristics continue to be active areas of research Bürgi et al., 2002, 2003; Meijer et al., 2003; Hamadani and Natelson, 2004; Pesavento et al., 2004 .”