Correlated scanning Kelvin probe and conductive atomic force microscopy studies of dislocations in gallium nitride

By B. Simpkins, E. Yu, P. Waltereit, J. Speck. 2003

193 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/875afd48d4514681f6cb1b5246b50cd8b3fe09bc

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1. R. Oliver

Citations in the corpus

• Advances in AFM for the electrical characterization of semiconductors (2008, background): “Other researchers, however, have demonstrated a correlation between TDs and increased current flow even when the TD pits were too small to be imaged directly, and might thus be expected to decrease the tip–sample contact area [179].”