Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials

By P. Heaney, E. Vicenzi, L. Giannuzzi, K. Livi. 2001

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Minimizing damage during FIB sample preparation of soft materials (2012, background): “Many geological materials containing submicrometre fossil features or other organic matter also require FIB sample preparation (Heaney et al., 2001; Obst et al., 2005; Schiffbauer & Xiao, 2009).”
Novel application of focused ion beam electron microscopy (FIB-EM) in preparation and analysis of microfossil ultrastructures: A new view of complexity in early eukaryotic organisms (2009, methodology): “TEM sample preparation was the original high-end use for these instruments (e.g., Giannuzzi et al., 1998, 1999; Heaney et al., 2001; among numerous others).”