Novel application of focused ion beam electron microscopy (FIB-EM) in preparation and analysis of microfossil ultrastructures: A new view of complexity in early eukaryotic organisms

By James D. Schiffbauer, Shuhai Xiao. 2009

90 citations recorded by the source corpus.

Subfields: Geophysics, Mechanics of Materials, Paleontology

View Paper: https://www.semanticscholar.org/paper/4d1851301fb6921236cd68ed93739adc36927450

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Citations in the corpus

• Minimizing damage during FIB sample preparation of soft materials (2012, background): “Many geological materials containing submicrometre fossil features or other organic matter also require FIB sample preparation (Heaney et al., 2001; Obst et al., 2005; Schiffbauer & Xiao, 2009).”