Three-Dimensional X-Ray Diffraction Microscopy

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The High Energy Materials Science Beamline (HEMS) at PETRA III (2010, methodology): “Poulssen [14], and a dedicated micro-tomography set-up identical to the one at the Imaging Beamline P05 which will operate in the complementary energy range 5-50 keV.”
Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction (2010, neutral): “…(1) relating reciprocal space to the Cartesian grain system by Gc ¼ BGhkl is defined from the reciprocal lattice constants ða ; b ; c ; ; ; Þ as (Poulsen, 2004) B ¼ a b cos c cos 0 b sin c sin cos 0 0 c sin sin 0 @ 1 A ð5Þ and its direct-space counterpart relating any direct-space…”
Martensitic transformation of individual grains in low-alloyed TRIP steels (2007, methodology): “We have assessed the stability of individual austenite grains by using the state-of-the art three-dimensional synchrotron X-ray diffraction microscope [8].”
Forward modeling method for microstructure reconstruction using x-ray diffraction microscopy: Single-crystal verification (2006, methodology): “Facilities at the Advanced Photon Source, while adequate for the silicon measurements presented here and preliminary work on polycrystals, are currently being upgraded.”