Forward modeling method for microstructure reconstruction using x-ray diffraction microscopy: Single-crystal verification

By Robert M. Suter, D. Hennessy, C. Xiao, Ulrich Lienert. 2006

238 citations recorded by the source corpus.

Subfields: Materials Chemistry, Radiation, Radiology, Nuclear Medicine and Imaging

View Paper: https://www.semanticscholar.org/paper/0d9833d6b04a35237d09a4a4ea3b229093dd617b

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Materials Chemistry

1. Loïc Renversade
2. Henning Friis Poulsen
3. R. Quey

In Radiation

1. Henning Friis Poulsen
2. Loïc Renversade
3. R. Quey

In Radiology, Nuclear Medicine and Imaging

1. Henning Friis Poulsen
2. Loïc Renversade
3. R. Quey

Citations in the corpus

• Optimal polyhedral description of 3D polycrystals: Method and application to statistical and synchrotron X-ray diffraction data (2018, methodology): “Such is also the case for polycrystal images provided by synchrotron X-ray diffraction [8, 9], which motivated the development of dedicated meshing procedures [27,28].”
• An introduction to three-dimensional X-ray diffraction microscopy (2012, methodology): “The two most popular programs today for OIM are the forward-simulation program by Suter et al. (2006) and GrainSweeper by Schmidt, both presented above.”