Stability of transparent zinc tin oxide transistors under bias stress

By P. Görrn, P. Hölzer, Thomas Riedl, Wolfgang Kowalsky, J. Wang, T. Weimann, P. Hinze, S. Kipp. 2007

208 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/77ed5874d6c42c7be1a70a83eadbe7fbb25942c2

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. John F. Conley

In Materials Chemistry

1. John F. Conley

Citations in the corpus

• Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors (2010, methodology): “[36] showed that, depending on the composition of their PA-PLD ZTO”