Mechanical stress effect on imprint behavior of integrated ferroelectric capacitors
By Alexei Gruverman, B. Rodriguez, A. Kingon, Robert J. Nemanich, A. Tagantsev, J. Cross, M. Tsukada. 2003
237 citations recorded by the source corpus.
Subfields: Biomedical Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/684e36372cf4c63ce835e4d225e8dfa83fd86817
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Biomedical Engineering
In Materials Chemistry
Citations in the corpus
- Flexoelectric Effect in Solids (2013, background): “, who demonstrated that the polarization state of a ferroelectric Pb(Zr,Ti)O3 capacitor can be reversed by strain gradients generated by bending of the underlying Si substrate [22].”
- Fundamentals of flexoelectricity in solids (2013, background): “The data on the flexoelectricity-driven polarization switching [20, 77] reveals a very strong switching action of the strain gradient (much stronger than that expected for the static bulk flexoelectric effect).”