Amorphous IZO-based transparent thin film transistors
By D. Paine, B. Yaglioglu, Z. Beiley, Sunghwan Lee. 2008
222 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry, Polymers and Plastics
View Paper: https://www.semanticscholar.org/paper/66366de6584707346c34b00733616f12cf060edb
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In Electrical and Electronic Engineering
In Materials Chemistry
In Polymers and Plastics
Citations in the corpus
- Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors (2010, methodology): “Paine et al. [ 28 ] examined unpassivated SBG IZO TTFTs, with the SiOx gate dielectric deposited via plasma-enhanced chemical vapor deposition (PECVD) at 280 ◦ C and with the”