Electron tunneling through ultrathin boron nitride crystalline barriers.

By L. Britnell, R. Gorbachev, R. Jalil, B. Belle, F. Schedin, M. Katsnelson, L. Eaves, S. Morozov, Alexander S. Mayorov, N. M. R. Peres and 5 more. Nano letters (Print), 2012

732 citations recorded by the source corpus.

We investigate the electronic properties of ultrathin hexagonal boron nitride (h-BN) crystalline layers with different conducting materials (graphite, graphene, and gold) on either side of the barrier layer. The tunnel current depends exponentially on the number of h-BN atomic layers, down to a monolayer thickness. Conductive atomic force microscopy scans across h-BN terraces of different thickness reveal a high level of uniformity in the tunnel current. Our results demonstrate that atomically thin h-BN acts as a defect-free dielectric with a high breakdown field. It offers great potential for applications in tunnel devices and in field-effect transistors with a high carrier density in the conducting channel.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/5d476b33afd9974a87db4280d1e8e87c3e2121f8

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In Electrical and Electronic Engineering

  1. K. Novoselov
  2. A.K. Geim
  3. Francisco Guinea
  4. Zhen Zhou
  5. L. Britnell
  6. R. Gorbachev
  7. Qing Tang
  8. Dehui Deng

In Materials Chemistry

  1. K. Novoselov
  2. A.K. Geim
  3. N. M. R. Peres
  4. Francisco Guinea
  5. Zhen Zhou
  6. A. Mishchenko
  7. Zhongfang Chen
  8. L. Britnell

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