Diffraction analysis of the microstructure of materials

By E. J. Mittemeijer, P. Scardi. 2004

464 citations recorded by the source corpus.

Subfields: General Materials Science, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/4fecd455b9286dba185bfa6b5fad659b278da88d

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In General Materials Science

1. H. Clemens
2. L. Hultman
3. P. Mayrhofer
4. C. Mitterer

In Materials Chemistry

1. H. Clemens
2. P. Mayrhofer
3. C. Mitterer
4. L. Hultman
5. Yury Gogotsi
6. J. Musil
7. Michel W. Barsoum
8. A. Anders

Citations in the corpus

• Size–strain line-broadening analysis of the ceria round-robin sample (2004, unknown): “The broadening of diffraction lines occurs for two principal reasons: instrumental effects and physical origins [for the most current review articles on this subject, consult the recent monographs edited by Snyder et al. (1999) and Mittemeijer & Scardi (2004)].”
• Microstructural design of hard coatings (2006, methodology): “Average grain sizes d are also estimated from XRD results by fitting appropriate diffraction peaks with Cauchy functions [85] whose maxima are at bulk TiN and TiB2 diffraction positions.”
• The “state of the art” of the diffraction analysis of crystallite size and lattice strain (2008, unknown): “[1] and references therein).”
• Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction (2005, unknown): “Further, the analysis of microstresses/strains from diffraction line broadening has been excluded (see, for example, Mittemeijer & Scardi, 2004).”