Use ECP, not ECC, for hard failures in resistive memories

By Stuart E. Schechter, Gabriel H. Loh, Karin Strauss, Doug Burger. International Symposium on Computer Architecture, 2010

352 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/4e2e21f9f4ff9f7f2811a75ab6be48989838f25f

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Karin Strauss
2. Jacob Nelson
3. Luis Ceze
4. Adrian Sampson
5. Shimeng Yu
6. Yuan Xie
7. Zhang Tao
8. Rajeev Balasubramonian

Citations in the corpus

• Overcoming the challenges of crossbar resistive memory architectures (2015, background): “In addition , it can benefit from the solutions proposed for the PCM [5] [16] [16] [37] [57] [36] [40] [14] [16] [35] [39] [41] [53] [1].”
• Approximate storage in solid-state memories (2013, methodology): “Prior work has also considered low-overhead techniques for hiding failures in memories that experience wear-out [11, 34, 39, 40].”