Power MOSFET Switching Loss Analysis: A New Insight

By Z. John Shen, Yali Xiong, Xu Cheng, Yue-nong Fu, P. Kumar. Conference Record of the 2006 IEEE Industry Applications Conference Forty-First IAS Annual Meeting, 2006

159 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/4ccbbb05ace935345b7d0b20836908dfa0f1f247

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In Electrical and Electronic Engineering

  1. Yali Xiong

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