Reduced-Order Models for MEMS Applications
By Ali H. Nayfeh, Mohammad Ibrahim Younis, Eihab M. Abdel-Rahman. 2005
321 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/4a491ac143c523d2ad4e002448e3838381aaded3
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Atomic and Molecular Physics, and Optics
- Romesh C. Batra
- Maurizio Porfiri
- Davide Spinello
- Slava Krylov
- Hassen M. Ouakad
- B. Ilic
- Stella Lulinsky
- Kimberly L. Turner
In Electrical and Electronic Engineering
- Romesh C. Batra
- Maurizio Porfiri
- Davide Spinello
- Slava Krylov
- Hassen M. Ouakad
- B. Ilic
- Stella Lulinsky
- Kimberly L. Turner
Citations in the corpus
- Nonlinear Dynamics and Its Applications in Micro- and Nanoresonators (2010, background): “[40], which compares domain and point-wise expansion techniques, concluding that domain methods provide better results, provided that the basis functions are judiciously selected.”
- Bistability of curved microbeams actuated by fringing electrostatic fields (2011, methodology): “Note that in the case of initially straight beams, RO models based on the Galerkin decomposition with linear eigenmodes as shape functions were proven to be a reliable tool for the analysis of the static and dynamic behavior of electrostatically operated structures [48].”
- Review of modeling electrostatically actuated microelectromechanical systems (2007, methodology): “An overview of reduced-order modeling techniques for MEMSs can be found in [69].”
- Nonlinear Dynamics of MEMS Arches Under Harmonic Electrostatic Actuation (2010, methodology): “In previous works [25]– [30], we presented analytical and computational methods, and reduced-order models (ROMs) to investigate the static and dynamic behaviors of straight microbeams under electrostatic and electric harmonic loads.”
- Mathematical Analysis of Partial Differential Equations Modeling Electrostatic MEMS (2010, methodology): “in [137], especially if one accounts for moderately large deflections, since one needs to use the dynamic analogue of the von Kármán equations.”