Defect states in the high-dielectric-constant gate oxide LaAlO3

By K. Xiong, John Robertson, S. Clark. 2006

150 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/48c8c95e10b06180e25c6dda09c832305a40fcc2