Schottky barrier diodes for millimeter wave detection in a foundry CMOS process
By S. Sankaran, O. KennethK.. IEEE Electron Device Letters, 2005
149 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/46cc95f3498bac9ec2bb910052b7348610f3ccc5
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
- Ho-Jin Song
- Gabriel M. Rebeiz
- Tadao Nagatsuma
- Ian F. Akyildiz
- Josep Miquel Jornet
- Laurent Dussopt
- Chong Han
- Kamran Entesari
Citations in the corpus
- Present and Future of Terahertz Communications (2011, background): “Si-CMOS process can also operate at over 1 THz [58], and frequency multipliers and mixers using the Si-SBDs have been successfully demonstrated at over 100 GHz [59]–[61].”
- Design and Characterization of $W$-Band SiGe RFICs for Passive Millimeter-Wave Imaging (2010, background): “Millimeter-wave Schottky diode detectors can be implemented in standard SiGe/CMOS processes [20], [21], but these typically have a high NEP in comparison to the high-responsivity III–”
- A 0.65 THz Focal-Plane Array in a Quarter-Micron CMOS Process Technology (2009, unknown): “The terahertz capability of BiCMOS technologies may be further extended through integration of silicon Schottky diodes with cut-off frequencies higher than 1 THz [14], [15].”