Correlation between optoelectronic and structural properties and epilayer thickness of AlN

By B. Pantha, Rajendra Dahal, M. Nakarmi, N. Nepal, J. Li, Jingyu Lin, Hongxing Jiang, Q. Paduano, D. Weyburne. 2007

145 citations recorded by the source corpus.

Subfields: Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/4577031cb06ecd84196bc25708943c74bc265261