Class-Specific, Top-Down Segmentation

By Eran Borenstein, Shimon Ullman. 2002

494 citations recorded by the source corpus.

Subfields: Computer Vision and Pattern Recognition, Industrial and Manufacturing Engineering

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Computer Vision and Pattern Recognition

  1. Luc Van Gool
  2. Jitendra Malik
  3. Andrew Zisserman
  4. Xiaogang Wang
  5. Ming-Hsuan Yang
  6. Dacheng Tao
  7. Trevor Darrell
  8. Bernt Schiele

In Industrial and Manufacturing Engineering

  1. Alan L. Yuille
  2. Luc Van Gool
  3. Andrea Vedaldi
  4. Iasonas Kokkinos
  5. Andrew Zisserman
  6. Svetlana Lazebnik
  7. Kristen Grauman
  8. Simon Lacoste-Julien

Citations in the corpus