Mechanical behavior of ultrathin microcantilever
By Jinling Yang, Takahito Ono, Masayoshi Esashi. 2000
142 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/42d0b824fefa33c03bbcb8c62af79c419fefe244
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
Citations in the corpus
- Energy dissipation in submicrometer thick single-crystal silicon cantilevers (2002, methodology): “As discussed in [ 7 ], the last step of the fabrication process (O asher) of the cantilevers forms a thin SiO layer on the surface, which finally causes surface energy loss [30]‐[32].”