Mechanical measurements at the micron and nanometer scales

By W. Knauss, I. Chasiotis, Ying Huang. 2003

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Assessment of Digital Image Correlation Measurement Errors: Methodology and Results (2009, background): “Very few studies [19,34–37] address situations with spatially fluctuating displacement fields.”
Mixed numerical–experimental technique for orthotropic parameter identification using biaxial tensile tests on cruciform specimens (2007, methodology): “The DIC technique has been developed in the 1980’s and has since then extensively been evaluated (Knauss et al., 2003; Schreier et al., 2000; Sutton et al., 1988) and improved (Bruck et al., 1989; Sutton et al., 1986; Cheng et al., 2002; Yoneyama et al., 2006).”
Development of Patterns for Digital Image Correlation Measurements at Reduced Length Scales (2007, methodology): “Another complimentary measurement method employs an AFM and uses surface roughness as a characteristic random pattern [29–33] so that digital image correlation can be employed to obtain surface deformations at the nanoscale.”
Quality assessment of speckle patterns for digital image correlation (2006, background): “It has already been shown [10-13] that the subset size is always a critical parameter in the correlation process.”