Thin Film Materials: Stress, Defect Formation and Surface Evolution

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Measurement and modeling of the mechanical and electrochemical response of amorphous Si thin film electrodes during cyclic lithiation (2013, methodology): “In particular, the molar density and elastic properties of un-lithiated amorphous Si were determined from refs [53], [59], [60]; while the volumetric expansion of Si with Li concentration was taken from ref [61].”
Stress-assisted discontinuous grain growth and its effect on the deformation behavior of nanocrystalline aluminum thin films (2006, result): “This observation is consistent with thin-film constraints that place an upper bound on the grain size [30–33].”
Mechanics of Solids and Materials (2006, methodology): “(25.41) Freund and Suresh (2003) have carried out this analysis and found by straightforward integration that ū(2)x = − 2σ0aλy Ē √ λ2x + λ2y sin(ωxx) cos(ωy y), ū(2)y = − 2σ0aλx Ē √ λ2x + λ2y cos(ωxx) sin(ωy y), ū(2)z = 0.”
In situ measurement of biaxial modulus of Si anode for Li-ion batteries (2010, methodology): “trate-curvature changes during electrochemical lithiation and delithiation. The relationship between the biaxial film stress, σ, and the substrate-curvature change Δκ, is given by the Stoney equation [6,7], 2 6(1 ) r ss f s Eh h κ σσ υ Δ =+ − 1 ELECTROCHEMISTRY COMMUNICATIONS, 12(11), 1614-1617 2010”