Effect of current crowding on vacancy diffusion and void formation in electromigration

By King-Ning Tu, C. Yeh, C. Y. Liu, Chih Chen. 2000

149 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/3bc2332e43555b4bdc8503c966614d8ae7ab15b8