Results on disordered materials from the GEneral Materials diffractometer, GEM, at ISIS ☆
By A. Hannon. 2005
233 citations recorded by the source corpus.
Subfields: Geophysics, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/3766c6117e8a9b18786d3a596ed917f0cf339db4
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In Materials Chemistry
Citations in the corpus
- Applications of an amorphous silicon-based area detector for high-resolution, high-sensitivity and fast time-resolved pair distribution function measurements (2007, background): “These data demonstrate how the properties of the a-Si detector improve the relative ease, reliability, speed and efficiency with which high-quality highresolution X-ray PDF data may be obtained with resolutions matching those routinely achieved at spallation neutron sources (Hannon, 2005).”