VARIUS: A Model of Process Variation and Resulting Timing Errors for Microarchitects
By Smruti Ranjan Sarangi, Brian Greskamp, Radu Teodorescu, Jun Nakano, A. Tiwari, Josep Torrellas. IEEE transactions on semiconductor manufacturing, 2008
433 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Hardware and Architecture
View Paper: https://www.semanticscholar.org/paper/37204b89f7a1276fa572ed5bf6dab49185cc2d61
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In Electrical and Electronic Engineering
In Hardware and Architecture
Citations in the corpus
- Variation-Aware Application Scheduling and Power Management for Chip Multiprocessors (2008, methodology): “To model WID variation, we use the VARIUS model [30, 37] to generate Vth and Leff variation maps.”