Characterization and optimization of scan speed for tapping-mode atomic force microscopy
By T. Sulchek, G. Yaralioglu, C. Quate, S. Minne. 2002
144 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/344bac113eb7f69c05ecd835ea759869ee731dd4
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
Citations in the corpus
- Design and input-shaping control of a novel scanner for high-speed atomic force microscopy (2008, unknown): “the cantilever in tapping-mode [23], the scanning unit [3,19], and the actuator for topographical feedback [18].”
- Design and Modeling of a High-Speed AFM-Scanner (2007, background): “The scanning speed of current AFM systems is limited due to the dynamic behavior of the individual microscope components.”