Thickness-dependent dielectric constants of (Ba,Sr)TiO3 thin films with Pt or conducting oxide electrodes
By C. S. Hwang. 2002
144 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/330bad8d79dc657ca67b09ab4093e6a1444a7e9c
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In Electrical and Electronic Engineering
- Yi Cui
- J. Shan
- Joshua E. Goldberger
- T. Heinz
- Sayeef Salahuddin
- Mauricio Terrones
- Rodney S. Ruoff
- M. Kuno
In Materials Chemistry
Citations in the corpus
- Progress, challenges, and opportunities in two-dimensional materials beyond graphene. (2013, background): “Metal oxide thin films grown by conventional vapor deposition techniques often show decreasing dielectric constants with decreasing film thickness.(118,311,312) One reason for the degradation in dielectric properties is the high temperatures that complex vapor processing requires, often above 600 C,”